Challenges of time domain measurement of field-field correlation for complex PCBs

Measurements of field-field correlation in the time domain can be used to characterize stochastic broadband emissions from complex sources. A two-probe scanning measurement system is developed and used to sample the stochastic emissions in the near-field of two such sources: a reverberation chamber with a rectangular aperture and a generic printed circuit board (PCB). We show that measured field data can be utilized in numerical wave propagation schemes to predict the stochastic fields in and radiated from a packaged device.