DocumentCode :
2212814
Title :
Reliability Factors
Author :
Frary, J.M.
Author_Institution :
Storage Technology Corporation
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
144
Lastpage :
151
Keywords :
Buildings; Costs; Degradation; Fault tolerance; Integrated circuit reliability; Manufacturing processes; Material storage; Protection; Q factor; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666302
Filename :
666302
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2212814
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