مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2213009

Title :

Survey Of Known-good-die Technologies

Author :

Vasquez, Barbara ; Lindsey, Scott

Author_Institution :

Motorola

fYear :

1993

fDate :

24-27 Oct 1993

Firstpage :

152

Lastpage :

161

Keywords :

Contacts; Fixtures; Paper technology; Production; Pulp manufacturing; Semiconductor device manufacture; Semiconductor device packaging; Temperature distribution; Testing; Wafer scale integration;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report, 1993 International

Type :

conf

DOI :

10.1109/IRWS.1993.666303

Filename :

666303

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2213009