Title :
FPGA-Optimised Uniform Random Number Generators Using LUTs and Shift Registers
Author :
Thomas, David B. ; Luk, Wayne
Author_Institution :
Imperial Coll. London, London, UK
fDate :
Aug. 31 2010-Sept. 2 2010
Abstract :
FPGA-optimised Random Number Generators (RNGs) are more resource efficient than software-optimised RNGs, as they can take advantage of bit-wise operations and FPGA-specific features. However, it is difficult to concisely describe FPGA-optimised RNGs, so they are not commonly used in real-world designs. This paper describes a new type of FPGA RNG called a LUT-SR RNG, which takes advantage of bit-wise XOR operations and the ability to turn LUTs into shift-registers of varying lengths. This provides a good resource-quality balance compared to previous FPGA-optimised generators, between the previous high-resource high-quality LUT-FIFO RNGs and low-resource low-quality LUT-OPT RNGs. The LUT-SR generators can also be expressed using a simple C++ algorithm contained within the paper, allowing 60 fully-specified LUT-SR RNGs with different characteristics to be embedded in the paper, backed up by an online set of VHDL generators and test-benches.
Keywords :
Monte Carlo methods; field programmable gate arrays; hardware description languages; optimisation; random number generation; shift registers; FPGA; LUT FIFO RNG; LUT OPT RNG; VHDL generator; XOR operation; bitwise operation; resource quality balance; shift register; software optimised RNG; uniform random number generator; FPGA; Monte Carlo; RNG; Random Number;
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2010 International Conference on
Conference_Location :
Milano
Print_ISBN :
978-1-4244-7842-2
DOI :
10.1109/FPL.2010.25