• DocumentCode
    2213747
  • Title

    Surface sterilization with high energy ions

  • Author

    Meixler, L. ; Schmidt, J.

  • Author_Institution
    Plasma Phys. Lab., Princeton, NJ, USA
  • fYear
    2002
  • fDate
    26-30 May 2002
  • Firstpage
    311
  • Abstract
    Summary form only given. There is a need for sterilization approaches that will deal with bacterial spores on a short time scale and without chemical agents. High-energy (e.g. 50 keV) ions, extracted from a low-density plasma using an ion implantation approach, have the theoretical potential for sufficient spore damage to preclude germination. The high dose rate, resulting from a modest ion current density to the surface to be sterilized, is a product of the short stopping distance for the implanted ions. This approach features a low density plasma, formed under modest vacuum conditions, with a short (e.g. 10 micro second) surface bias pulse to develop a high energy ion current. Hydrogen ions provide the best penetration and hydrogen is therefore the working gas of choice. Tests are underway to demonstrate this approach as a sterilization option for plastic containers.
  • Keywords
    biological techniques; microorganisms; plasma materials processing; surface treatment; 50 keV; H; bacterial spores; dose rate; germination; high energy ion current; high energy ions; high-energy ions; hydrogen ions; implanted ions; ion current density; ion extraction; ion implantation; ion penetration; low density plasma formation; low-density plasma; plastic containers; spore damage; sterilization option; stopping distance; surface bias pulse; surface sterilization; vacuum conditions; working gas; Chemicals; Current density; Elementary particle vacuum; Fungi; Hydrogen; Ion implantation; Microorganisms; Plasma chemistry; Plasma density; Plasma immersion ion implantation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
  • Conference_Location
    Banff, Alberta, Canada
  • Print_ISBN
    0-7803-7407-X
  • Type

    conf

  • DOI
    10.1109/PLASMA.2002.1030636
  • Filename
    1030636