DocumentCode
2213833
Title
Characterisation, Modelling and Design of Bond-Wire Interconnects for Chip-Package Co-Design
Author
Chandrasekhar, Arun ; Stoukatch, Serguei ; Brebels, Steven ; Balachandran, Jayaprakash ; Beyne, Eric ; De Raedt, Walter ; Nauwelaers, Bart ; Poddar, Anindya
Author_Institution
MCP-MaRS, IMEC vzw, Kapeldreef 75, 3001, Leuven, Belgium. Phone: +32 16 288228, E-mail: achandra@imec.be
fYear
2003
fDate
Oct. 2003
Firstpage
301
Lastpage
304
Abstract
This work is a comprehensive experimental investigation of chip to package wirebond interconnects for chip-package co-design. Wirebonds are interconnect bottlenecks in RF design, but are difficult to avoid due to their low cost and manufacturing ease. We have shown measurements on wirebonds in coplanar configuration with different return paths and also the cross coupling. We have also extracted lumped and distributed models and demonstrate the excellent agreement with measurements atleast upto 15GHz. We have proposed multi-wirebonds as a potential solution for better impedance matching. Different types of inductors with Q-factors of upto 100 have also been illustrated. We show influence of encapsulant on wirebonds and finally we also demonstrate a methodology to extract the time-domain response from S-parameters.
Keywords
Bonding; Costs; Impedance matching; Inductors; Manufacturing; Packaging; Q factor; Radio frequency; Semiconductor device measurement; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2003 33rd European
Conference_Location
Munich, Germany
Print_ISBN
1-58053-834-7
Type
conf
DOI
10.1109/EUMA.2003.340950
Filename
4143014
Link To Document