• DocumentCode
    2214064
  • Title

    Thermotropic liquid crystalline polyimides toward high heat conducting materials for 3D chip stack

  • Author

    Murase, Tomohide ; Aikyou, Hiroyuki ; Mizutani, Fumikazu ; Shoji, Yu ; Higashihara, Tomoya ; Ueda, Mitsuru

  • Author_Institution
    Functional Mater. Lab., Res. Center, Inc., Yokohama, Japan
  • fYear
    2009
  • fDate
    28-30 Sept. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Novel thermotropic liquid crystalline semi-aliphatic polyimide containing polysiloxane unit has been developed. The polyimide film exhibits high thermal stability and liquid crystallinity with lower transition temperature. Poly(amic acid) solution used as a precursor of the polyimide has very good surface wetting properties for a silicon wafer, resulting in homogeneous polyimide thin film formation on the wafer after thermal imidization below 200degC. The silicon wafer coated with the polyimide thin film can be bonded to another silicon wafer, or to another polyimide film on heating at 270degC with relatively low pressure. Moreover the bonding is repairable on heating again. It is proposed that the polyimide can be utilized as a polymer adhesive for three dimensional chip stack.
  • Keywords
    adhesive bonding; adhesives; chip scale packaging; integrated circuit bonding; thermal stability; wafer level packaging; 3D chip stack; bonding; homogeneous polyimide thin film formation; liquid crystallinity; polymer adhesive; polysiloxane unit; silicon wafer; surface wetting property; thermal imidization; thermal stability; thermotropic liquid crystalline semi-aliphatic polyimide; Conducting materials; Crystallization; Heating; Polyimides; Polymer films; Semiconductor thin films; Silicon; Temperature; Thermal stability; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D System Integration, 2009. 3DIC 2009. IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-4511-0
  • Electronic_ISBN
    978-1-4244-4512-7
  • Type

    conf

  • DOI
    10.1109/3DIC.2009.5306567
  • Filename
    5306567