DocumentCode
2214768
Title
Improved fault diagnosis in scan-based BIST via superposition
Author
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution
University of California
fYear
2000
fDate
2000
Firstpage
55
Lastpage
58
Keywords
Automatic testing; Built-in self-test; Circuit faults; Compaction; Computer science; Design engineering; Fault diagnosis; Logic testing; Polynomials; Programmable logic arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855276
Filename
855276
Link To Document