• DocumentCode
    2214769
  • Title

    Seebeck coefficient of Bi-Sb samples grown by mechanical alloying

  • Author

    Rodríguez, J.E. ; Cadavid, D.

  • Author_Institution
    Dept. of Phys., Univ. Nacional de Colombia, Bogota, Colombia
  • fYear
    2005
  • fDate
    19-23 June 2005
  • Firstpage
    396
  • Lastpage
    398
  • Abstract
    We report Seebeck coefficient, S(T) and electrical resistivity, ρ(T) measurements of Bi0.88Sb0.12 compounds prepared by mechanical alloying (MA). The behavior of the Seebeck coefficient and electrical resistivity were studied as a function of temperature and the milling time (MT). The milling process was carried out at room temperature and took different values from 0 hours to 45 hours. The Seebeck coefficient was measured by using the differential method in the temperature range between 77 K and 300 K. S(T) is negative in whole temperature range measured and it changes from -60 μV/K for the samples with low milling time up to reach values close to -160 μV/K in the samples processed through 45 hours. The thermoelectric power factor, PF increases with the temperature and the milling time, it reaches values close to 5 μW/K2cm. This result allows us to consider the use of this simple and inexpensive method to grow this kind of thermoelectric materials.
  • Keywords
    Seebeck effect; antimony alloys; bismuth alloys; electrical resistivity; mechanical alloying; milling; semiconductor materials; thermoelectric power; 0 to 45 hour; 77 to 300 K; Bi0.88Sb0.12; Seebeck coefficient; differential method; electrical resistivity; mechanical alloying; milling; thermoelectric power; Alloying; Bismuth; Electric resistance; Electric variables measurement; Mechanical variables measurement; Milling; Temperature distribution; Temperature measurement; Thermoelectricity; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2005. ICT 2005. 24th International Conference on
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-9552-2
  • Type

    conf

  • DOI
    10.1109/ICT.2005.1519970
  • Filename
    1519970