DocumentCode
2215686
Title
Dynamic noise analysis in precharge-evaluate circuits
Author
Somasekhar, Dinesh ; Choi, Seung Hoon ; Roy, Kaushik ; Ye, Yibin ; De, Vivek
Author_Institution
Purdue University
fYear
2000
fDate
2000
Firstpage
243
Lastpage
246
Keywords
Capacitance; Circuit analysis; Circuit noise; Circuit simulation; Coupling circuits; Crosstalk; Logic circuits; Noise level; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2000. Proceedings 2000
Print_ISBN
1-58113-187-9
Type
conf
DOI
10.1109/DAC.2000.855311
Filename
855311
Link To Document