DocumentCode :
2216677
Title :
Access-chip Early Reliability Estimation
Author :
Moran, Dave E.
Author_Institution :
IBM Microelectronics Division
fYear :
1993
fDate :
24-27 Oct 1993
Firstpage :
218
Lastpage :
219
Keywords :
Application software; Circuits; Degradation; Delay estimation; Electromigration; Hot carriers; Life estimation; Lifetime estimation; Logic arrays; Microprocessors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report, 1993 International
Type :
conf
DOI :
10.1109/IRWS.1993.666318
Filename :
666318
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2216677
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