DocumentCode
2216896
Title
Wafer Bin Triggering: Containment of Statistically Abnormal Wafers
Author
Kowalczyk, Peter
Author_Institution
Delco Electronics Corporation
fYear
1993
fDate
24-27 Oct 1993
Firstpage
220
Lastpage
223
Keywords
Aggregates; Condition monitoring; Electronic equipment testing; Failure analysis; Gate leakage; Gaussian distribution; Histograms; Manufacturing; Materials testing; Quality management;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report, 1993 International
Type
conf
DOI
10.1109/IRWS.1993.666319
Filename
666319
Link To Document