DocumentCode
2219481
Title
Enhancing realistic fault secureness in parity prediction array arithmetic operators by IDDQ monitoring
Author
Manich, S. ; Nicolaidis, M. ; Figueras, J.
Author_Institution
Univ. Politecnica de Catalunya, Barcelona, Spain
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
124
Lastpage
129
Abstract
Parity prediction arithmetic operator schemes have been widely studied in the past. Recently, it has been demonstrated that this prediction scheme can achieve Fault-Secureness in arithmetic circuits for stuck-at and stuck-open faults. In this paper it is shown that the detection capability improves if a current monitoring technique is used in conjunction with the parity prediction scheme. With this scheme the fault-secure property extends to bridging faults. The technique is validated by the topological design and SPICE simulation of a multiplier circuit
Keywords
fault diagnosis; logic arrays; logic testing; mathematical operators; multiplying circuits; IDDQ current monitoring; SPICE simulation; arithmetic circuits; bridging faults; fault detection; fault secureness; multiplier circuit; parity prediction array arithmetic operators; stuck-at faults; stuck-open faults; topological design; Adders; CMOS logic circuits; Circuit faults; Circuit testing; Computed tomography; Digital arithmetic; Electrical fault detection; Fault detection; Monitoring; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510846
Filename
510846
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