• DocumentCode
    2219481
  • Title

    Enhancing realistic fault secureness in parity prediction array arithmetic operators by IDDQ monitoring

  • Author

    Manich, S. ; Nicolaidis, M. ; Figueras, J.

  • Author_Institution
    Univ. Politecnica de Catalunya, Barcelona, Spain
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    124
  • Lastpage
    129
  • Abstract
    Parity prediction arithmetic operator schemes have been widely studied in the past. Recently, it has been demonstrated that this prediction scheme can achieve Fault-Secureness in arithmetic circuits for stuck-at and stuck-open faults. In this paper it is shown that the detection capability improves if a current monitoring technique is used in conjunction with the parity prediction scheme. With this scheme the fault-secure property extends to bridging faults. The technique is validated by the topological design and SPICE simulation of a multiplier circuit
  • Keywords
    fault diagnosis; logic arrays; logic testing; mathematical operators; multiplying circuits; IDDQ current monitoring; SPICE simulation; arithmetic circuits; bridging faults; fault detection; fault secureness; multiplier circuit; parity prediction array arithmetic operators; stuck-at faults; stuck-open faults; topological design; Adders; CMOS logic circuits; Circuit faults; Circuit testing; Computed tomography; Digital arithmetic; Electrical fault detection; Fault detection; Monitoring; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510846
  • Filename
    510846