DocumentCode :
2219481
Title :
Enhancing realistic fault secureness in parity prediction array arithmetic operators by IDDQ monitoring
Author :
Manich, S. ; Nicolaidis, M. ; Figueras, J.
Author_Institution :
Univ. Politecnica de Catalunya, Barcelona, Spain
fYear :
1996
fDate :
28 Apr-1 May 1996
Firstpage :
124
Lastpage :
129
Abstract :
Parity prediction arithmetic operator schemes have been widely studied in the past. Recently, it has been demonstrated that this prediction scheme can achieve Fault-Secureness in arithmetic circuits for stuck-at and stuck-open faults. In this paper it is shown that the detection capability improves if a current monitoring technique is used in conjunction with the parity prediction scheme. With this scheme the fault-secure property extends to bridging faults. The technique is validated by the topological design and SPICE simulation of a multiplier circuit
Keywords :
fault diagnosis; logic arrays; logic testing; mathematical operators; multiplying circuits; IDDQ current monitoring; SPICE simulation; arithmetic circuits; bridging faults; fault detection; fault secureness; multiplier circuit; parity prediction array arithmetic operators; stuck-at faults; stuck-open faults; topological design; Adders; CMOS logic circuits; Circuit faults; Circuit testing; Computed tomography; Digital arithmetic; Electrical fault detection; Fault detection; Monitoring; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
ISSN :
1093-0167
Print_ISBN :
0-8186-7304-4
Type :
conf
DOI :
10.1109/VTEST.1996.510846
Filename :
510846
Link To Document :
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