Title :
Low-cost diagnosis of defects in MCM substrate interconnections
Author :
Kim, Bruce C. ; Chatterjee, Abhijit ; Swaminathan, Madhavan
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
28 Apr-1 May 1996
Abstract :
Consistent with industry needs for low-cost MCM substrate test methods, we have earlier developed a single-probe technique for detecting near-opens and near-shorts in substrate interconnects. In this paper we show how a fault-dictionary can be used to accurately determine defect location, size, etc. Such information may be used to perform repair of MCM substrates
Keywords :
fault diagnosis; fault location; integrated circuit interconnections; integrated circuit testing; multichip modules; substrates; MCM substrate interconnections; defect location; defect size; fault-dictionary; low-cost diagnosis; substrate interconnect defects; Capacitance; Computer industry; Conducting materials; Costs; Materials testing; Optical interconnections; Optical materials; Packaging; Probes; Throughput;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510866
