DocumentCode
2220009
Title
March LR: a test for realistic linked faults
Author
van de Goor, A.J. ; Gaydadjiev, G.N. ; Mikitjuk, V.G. ; Yarmolik, V.N.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear
1996
fDate
28 Apr-1 May 1996
Firstpage
272
Lastpage
280
Abstract
Many march tests have already been designed to cover faults of different fault models. The complexity of these tests arises when linked faults are taken into consideration. This paper gives an overview of the most important and commonly used fault models, including the industry´s popular disturb fault model. The fault coverage of march tests is analysed in a novel way, i.e., in terms of their detection capabilities for: simple faults, and linked faults; whereby the infinite class of linked faults has been reduced to a set of realistic linked faults. Thereafter the paper presents a methodology to design tests for realistic linked faults, resulting in the new tests March LR, March LRD and March LRDD. These new tests will be shown to be more efficient and to offer a higher fault coverage than comparable existing tests
Keywords
fault diagnosis; integrated circuit testing; integrated memory circuits; March LR; March LRD; March LRDD; disturb faults; fault coverage; fault models; linked faults; march tests; semiconductor memories; Costs; Decoding; Design methodology; Fault detection; Informatics; Information technology; Marine vehicles; Production; Semiconductor device testing; Semiconductor memory;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location
Princeton, NJ
ISSN
1093-0167
Print_ISBN
0-8186-7304-4
Type
conf
DOI
10.1109/VTEST.1996.510868
Filename
510868
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