• DocumentCode
    2220009
  • Title

    March LR: a test for realistic linked faults

  • Author

    van de Goor, A.J. ; Gaydadjiev, G.N. ; Mikitjuk, V.G. ; Yarmolik, V.N.

  • Author_Institution
    Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
  • fYear
    1996
  • fDate
    28 Apr-1 May 1996
  • Firstpage
    272
  • Lastpage
    280
  • Abstract
    Many march tests have already been designed to cover faults of different fault models. The complexity of these tests arises when linked faults are taken into consideration. This paper gives an overview of the most important and commonly used fault models, including the industry´s popular disturb fault model. The fault coverage of march tests is analysed in a novel way, i.e., in terms of their detection capabilities for: simple faults, and linked faults; whereby the infinite class of linked faults has been reduced to a set of realistic linked faults. Thereafter the paper presents a methodology to design tests for realistic linked faults, resulting in the new tests March LR, March LRD and March LRDD. These new tests will be shown to be more efficient and to offer a higher fault coverage than comparable existing tests
  • Keywords
    fault diagnosis; integrated circuit testing; integrated memory circuits; March LR; March LRD; March LRDD; disturb faults; fault coverage; fault models; linked faults; march tests; semiconductor memories; Costs; Decoding; Design methodology; Fault detection; Informatics; Information technology; Marine vehicles; Production; Semiconductor device testing; Semiconductor memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1996., Proceedings of 14th
  • Conference_Location
    Princeton, NJ
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7304-4
  • Type

    conf

  • DOI
    10.1109/VTEST.1996.510868
  • Filename
    510868