Title :
Design of a fault tolerant 100 Gbits solid-state mass memory for satellites
Author :
Kluth, M.P. ; Simon, F. ; Le Gall, J.-Y. ; Müller, E.
Author_Institution :
Autom. & Intelligent Syst. Unit., Alcatel Alsthom Recherche, Marcoussis, France
fDate :
28 Apr-1 May 1996
Abstract :
This paper summarizes the studies conducted by Alcatel Espace and Alcatel Alsthom Recherche to design a new generation of fault tolerant 100 Gbits mass memories for satellites, based on VLSI components. In the context of space applications, stringent dependability constraints have to be met and fault tolerance is a design objective. To reach this tolerance mechanisms including error detection and tests are needed
Keywords :
VLSI; aerospace computing; error detection; fault tolerant computing; integrated circuit testing; semiconductor storage; special purpose computers; 100 Gbit; VLSI components; error detection; fault tolerant solid-state mass memory; satellite applications; space applications; testing; Automation; Computer interfaces; Fault tolerance; Fault tolerant systems; Intelligent systems; Memory management; Satellites; Solid state circuits; Testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1996., Proceedings of 14th
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7304-4
DOI :
10.1109/VTEST.1996.510869
