• DocumentCode
    2221486
  • Title

    CMOS high-speed I/Os - present and future

  • Author

    Lee, M. J Edward ; Dally, William J. ; Farjad-Rad, Ramin ; Ng, Hiok-Tiaq ; Senthinathan, Ramesh ; Edmondson, John ; Poulton, John

  • Author_Institution
    Velio Commun. Inc., Milpitas, CA, USA
  • fYear
    2003
  • fDate
    13-15 Oct. 2003
  • Firstpage
    454
  • Lastpage
    461
  • Abstract
    High-speed I/O circuits, once used only for PHYs, are now widely used for intra-system signaling as well because of their bandwidth, power, area, and cost advantages. This technology enables chips with over 1 Tb/s of I/O bandwidth today and over 10 Tb/s of bandwidth by 2010 as both signaling rates and number of high-speed I/Os increase with process scaling. Key technologies that enable this growth in I/O performance include low-jitter clock circuits and equalized signaling. An analysis of clock jitter and channel interference suggests that signaling rates should track transistor performance to rates of at least 40 Gb/s over boards, back-planes, and short-distance cables.
  • Keywords
    CMOS integrated circuits; high-speed integrated circuits; interference (signal); scaling circuits; synchronisation; system-on-chip; timing jitter; CMOS high-speed I/O circuit; I/O bandwidth; I/O transistor performance; channel interference; intra-system equalized signaling rate; low-jitter clock circuits; process scaling; short-distance cables; Bandwidth; CMOS technology; Circuits; Clocks; Costs; Interference; Jitter; Performance analysis; Signal analysis; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2003. Proceedings. 21st International Conference on
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-2025-1
  • Type

    conf

  • DOI
    10.1109/ICCD.2003.1240940
  • Filename
    1240940