DocumentCode :
2222309
Title :
Modeling the impact of local and distant electrode configuration on the stimulation pattern in micrometer-size neural probes
Author :
Mecheri, A.S. ; Eberle, W. ; Bartic, C. ; Gielen, G.
Author_Institution :
Bioelectron. Syst. Group, IMEC, Leuven, Belgium
fYear :
2009
fDate :
April 29 2009-May 2 2009
Firstpage :
179
Lastpage :
182
Abstract :
Electrical deep brain stimulation is a valuable last resort for the treatment of severe brain disorders when pharmaceutical drugs have proven to be ineffective for a particular patient. A major challenge of DBS is to achieve a high selectivity to allow efficient local stimulation of desired brain regions while minimizing side effects in neighboring regions., For discrimination at a single neuron level, we need electrodes of the same size of magnitude as that of the neurons which are in the 5 to 10 mum range. Exploration of the optimum configuration of a multitude of these microelectrodes requires finite element modeling (FEM) as an important tool for understanding the field distribution from these microelectrodes. Based on simulations in a 3D-FEM of a 10-contact 50-mum contact-size neural probe, we can show that configuring the neighboring electrodes around a stimulation electrode can be used for increasing field penetration depth into tissue. In addition, we investigate field asymmetry effects based on surrounding electrodes and the probe edge.
Keywords :
bioelectric phenomena; biological tissues; biomedical electrodes; brain; cellular biophysics; finite element analysis; medical disorders; microelectrodes; neurophysiology; patient treatment; brain disorder treatment; electrical deep brain stimulation; finite element modeling; microelectrode configuration; micrometer-size neural probe; single neuron level; size 5 mum to 10 mum; tissue field penetration depth; Brain stimulation; Drugs; Electrodes; Finite element methods; Medical treatment; Microelectrodes; Neurons; Pharmaceuticals; Probes; Satellite broadcasting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Engineering, 2009. NER '09. 4th International IEEE/EMBS Conference on
Conference_Location :
Antalya
Print_ISBN :
978-1-4244-2072-8
Electronic_ISBN :
978-1-4244-2073-5
Type :
conf
DOI :
10.1109/NER.2009.5109263
Filename :
5109263
Link To Document :
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