Improved statistical method for system-level ESD tests

Author

Renninger, Robert G.

Author_Institution

AT&T Bell Lab., Murray Hill, NJ, USA

fYear

1993

fDate

9-13 Aug 1993

Firstpage

20

Lastpage

25

Abstract

A method for system-level electrostatic discharge (ESD) tests based on both upper and lower statistical limits for system failure probability in an ESD environment is described. This test method specifies test performance with statistical parameters instead of with the more conventional, but less informative, ESD threshold voltage. The method is used to examine the ambiguous system reliability implications of the latest IEC 801-2 international ESD test specification. Step-by-step procedures, including optimal methods for rectifying unusual failures, are given for a reliability-based ESD test that fully meets IEC 801-2 requirements

Keywords

electrostatic discharge; failure analysis; measurement standards; probability; reliability; statistical analysis; testing; IEC 801-2 international ESD test specification; electrostatic discharge; lower statistical limits; optimal methods; statistical method; statistical parameters; system failure probability; system reliability; system-level ESD tests; test performance; unusual failures rectification; upper statistical limits; Electrostatic discharge; IEC standards; Manufacturing; Probability; Reliability; Robustness; Statistical analysis; System testing; Upper bound; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1993. Symposium Record., 1993 IEEE International Symposium on

Conference_Location

Dallas, TX

Print_ISBN

0-7803-1304-6

Type

conf

DOI

10.1109/ISEMC.1993.473788

Filename

473788