Modeling switched-current functional block circuits using VHDL-AMS language

Author

Shi, J.L. ; Zeng, X.

Author_Institution

Microelectron. Dept., Fudan Univ., Shanghai, China

fYear

2001

fDate

2001

Firstpage

58

Lastpage

61

Abstract

This paper proposes the behavioral models of the second-generation switched-current functional block circuits using the VHDL-AMS language. The proposed models cannot only characterize the ideal behavior of the SI circuits, but also capture the SI higher order non-ideal effects, which include the charge injection effects and device mismatch effects. The accuracy of the proposed models is verified by the VHDL-AMS simulator ZENI1.0. The experimental results have shown that compared with SPICE, the behavioral modeling error is less than 1.8%, while time-domain behavioral simulation speed up is 1 to 2 orders

Keywords

charge injection; circuit simulation; errors; hardware description languages; switched current circuits; VHDL-AMS language; VHDL-AMS simulator; ZENI1.0; behavioural models; charge injection effects; device mismatch effects; higher order nonideal effects; second-generation SI circuits; switched-current functional block circuits; time-domain behavioral simulation; Application specific integrated circuits; CMOS technology; Capacitance; Circuit simulation; Computational modeling; Microelectronics; SPICE; Signal design; Switches; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC, 2001. Proceedings. 4th International Conference on

Conference_Location

Shanghai

Print_ISBN

0-7803-6677-8

Type

conf

DOI

10.1109/ICASIC.2001.982498

Filename

982498