• DocumentCode
    2226832
  • Title

    Stability considerations in the application of PML absorbing boundary condition to FDTD simulation of microwave circuits

  • Author

    Naishadham, K.

  • Author_Institution
    Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    581
  • Abstract
    Berenger introduced the concept of a terminating boundary known as perfectly matched layer (PML), in which electromagnetic waves are absorbed without reflection, irrespective of frequency and angle of incidence of the incoming wave. This absorbing boundary condition promises to be very attractive for microwave CAD applications involving complex geometries such as high-density microwave integrated circuits and electronic packages, because the computational domain can be significantly reduced. This paper presents, for the first time, a rigorous analysis of the stability of the PML boundary condition applied to finite-difference time-domain (FDTD) simulation. We discuss the FDTD simulation of a high-Q microstrip filter to show improvement in computational efficiency without any manifestation of instability.
  • Keywords
    electromagnetic wave absorption; finite difference time-domain analysis; microwave circuits; numerical stability; FDTD simulation; PML absorbing boundary condition; complex geometries; computational efficiency; electromagnetic waves; electronic packages; finite-difference time-domain simulation; high-Q microstrip filter; high-density MICs; microwave CAD applications; microwave circuits; microwave integrated circuits; perfectly matched layer; stability; terminating boundary; Boundary conditions; Circuit simulation; Computational modeling; Electromagnetic reflection; Electromagnetic scattering; Finite difference methods; Frequency; Perfectly matched layers; Stability; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.511001
  • Filename
    511001