• DocumentCode
    2227728
  • Title

    Spectral differences of opposite sides of stripe rust infested winter wheat leaves using ASD´s Leaf Clip

  • Author

    Zhao, Jinling ; Yuan, Lin ; Luo, Juhua ; Du, Shizhou ; Huang, Linsheng ; Huang, Wenjiang

  • Author_Institution
    Beijing Res. Center for Inf. Technol. in Agric., Beijing, China
  • fYear
    2012
  • fDate
    22-27 July 2012
  • Firstpage
    6585
  • Lastpage
    6588
  • Abstract
    Stripe Rust, caused by Puccinia striiformis f. sp. tritici, has emerged as one of the most destructive foliar diseases of winter wheat (Triticum aestivum L.) and caused great yield loss. The primary objective of this study is to identify the stress characteristics of wheat leaves caused by such a disease. After performing artificial inoculation of stripe rust, hundreds of leaves with different infections were collected and leaf reflectance were conducted using ASD´s (Analytical Spectral Devices) leaf clip probe. Based on the nonequivalent optical properties on the opposite side of a leaf, their spectral characteristics were specifically compared and the correlations between disease severity indices and water or chlorophyll were further analyzed. The final results indicated that, for the face and back sides of stripe rust infected wheat leaves, some obvious differences existed in the spectral reflectance and correlation curves between foliar disease severity indexes (FDSIs) and reflectance, especially with the increase of infections.
  • Keywords
    crops; diseases; remote sensing; ASD leaf clip; Analytical Spectral Devices; Puccinia striiformis; Triticum aestivum L; artificial inoculation; foliar disease severity index; leaf reflectance; spectral difference; stress characteristics; stripe rust infested winter wheat leaves; yield loss; Agriculture; Correlation; Diseases; Face; Indexes; Reflectivity; Remote sensing; ASD Leaf Clip; Foliar disease severity index (FDSI); Leaf reflectance measurement; Stripe rust disease; Winter wheat;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
  • Conference_Location
    Munich
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4673-1160-1
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2012.6352090
  • Filename
    6352090