DocumentCode :
2227898
Title :
A cure rate model in reliability for complex system
Author :
Lin, J. ; Zhu, H.M.
Author_Institution :
Dept. of AMS, SKF China Ltd., Beijing, China
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
1395
Lastpage :
1399
Abstract :
This paper presents a new approach to do reliability analysis for complex system, where a certain fraction of the subsystems is defined as a ¿cure fraction¿ under the consideration that such subsystems are ¿longevous¿ compared with the entire system. Including introducing environment covariates and the joint power prior, the proposed model is developed with the Bayesian survival analysis method, and thus the problems for censored (or truncated) data in reliability tests can be resolved. In addition, a Markov chain Monte Carlo method based on Gibbs sampling is used to dynamically simulate the Markov chain of the parameters¿ posterior distribution. Finally, a numeric example is discussed to demonstrate the proposed model.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; reliability theory; Bayesian survival analysis method; Gibbs sampling; Markov chain Monte Carlo method; complex system reliability; cure rate model; environment covariates; parameter posterior distribution; Bayesian methods; Biological system modeling; Educational institutions; Hazards; Interference; Power system modeling; Power system reliability; Random variables; Sampling methods; Testing; Bayesian survival analysis; Gibbs sampler; Markov chain Monte Carlo; cure rate model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management, 2008. IEEM 2008. IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2629-4
Electronic_ISBN :
978-1-4244-2630-0
Type :
conf
DOI :
10.1109/IEEM.2008.4738099
Filename :
4738099
Link To Document :
بازگشت