Title :
The method of ultra-short pulse current-voltage and capacity-voltage characterization
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
Abstract :
The method of obtaining current-voltage (IVC) and capacity-voltage (CVC) characteristics of an element based at ultra-short baseband impact is considered. The impact can be shorter than duration of impulse response of an element.
Keywords :
electric current measurement; reflectometry; transient response; voltage measurement; CVC measurement; IVC measurement; PCV; PIV; capacity-voltage characterization; impulse response; nonlinear reflectometry; ultrashort pulse current-voltage method; Baseband; Current measurement; Electronic mail; Logic gates; Optical pulse generation; Pulse measurements; Ultra wideband technology;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2011 21th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-0883-1
