• DocumentCode
    2229697
  • Title

    Is My Software "Good Enough" to Release? - A Probabilistic Assessment

  • Author

    Donohue, Susan K. ; Dugan, Joanne Bechta

  • Author_Institution
    Dept. of Syst. & Inf. Eng., Virginia Univ., Charlottesville, VA
  • fYear
    2005
  • fDate
    7-7 April 2005
  • Firstpage
    5
  • Lastpage
    13
  • Abstract
    We present the basics of a probabilistic methodology to assess the overall quality of software preparatory to its release through the evaluation of process and product evidence, the " \´good enough\´ to release" (GETR) methodology, in this paper. GETR methodology has three main elements: a model whose elements represent activities and artifacts identified in the literature as being effective assessors of software quality, a process for populating certain parts of the model, and methods for analyzing the importance of contributions made by individual evidence to the determination of overall system quality. First, the methodology\´s components are briefly introduced. A demonstration of how the methodology can be applied is then given through two case studies reviewing release assessments for in-house developed analytical tools. The robustness of the model is also illustrated by the results of the case studies
  • Keywords
    belief networks; program verification; quality assurance; software quality; Bayesian belief network; good enough to release methodology; probabilistic assessment methodology; software quality assessment; software quality assurance; software release; software validation; software verification; Application software; Bayesian methods; Conferences; NASA; Robustness; Software engineering; Software quality; Uncertainty; Bayesian Belief Networks; ModelPopulation; Software Quality Assurance; Software Validation and Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Workshop, 2005. 29th Annual IEEE/NASA
  • Conference_Location
    Greenbelt, MD
  • Print_ISBN
    0-7695-2306-4
  • Type

    conf

  • DOI
    10.1109/SEW.2005.30
  • Filename
    1521189