Title :
Crosstalk noise model for shielded interconnects in VLSI-based circuits
Author :
Zhang, Junmou ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, NY, USA
Abstract :
Placing shields around a victim signal line is a common way to enhance signal integrity while minimizing delay uncertainty. An analytic model of the peak noise is developed for shielded interconnects, based on a pseudo-2π RC model. A design methodology for inserting shields between coupled interconnects, to reduce crosstalk noise, is presented.
Keywords :
VLSI; coupled circuits; crosstalk; electromagnetic shielding; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; VLSI-based circuits; coupled interconnects; crosstalk noise model; crosstalk noise reduction; delay uncertainty minimization; peak noise analytic model; pseudo-2π RC model; shielded interconnects; shielded victim signal line; signal integrity; CMOS technology; Capacitance; Circuit noise; Coupling circuits; Crosstalk; Delay effects; Design methodology; Integrated circuit interconnections; Semiconductor device modeling; Uncertainty;
Conference_Titel :
SOC Conference, 2003. Proceedings. IEEE International [Systems-on-Chip]
Print_ISBN :
0-7803-8182-3
DOI :
10.1109/SOC.2003.1241502
