Title :
A Sampled Data Approach To Yield Modeling And Analysis
Author :
O´Donoghue, G. ; Cheek, Gary
Author_Institution :
Anatog Devices Semiconductor, Wilmington, MA
Keywords :
Analog integrated circuits; CMOS digital integrated circuits; Circuit testing; Density measurement; Fault diagnosis; Integrated circuit yield; Loss measurement; Manufacturing; Predictive models; Semiconductor device modeling;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1993. ASMC 93 Proceedings. IEEE/SEMI
DOI :
10.1109/ASMC.1993.682488
