Title :
Fault diagnosis in analog and mixed mode low testability system
Author :
Starzyk, J. ; Pang, J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
Abstract :
This paper describes our views on how to detect faults in low testability analog or mixed mode (analog electro-mechanical) system. A new method is developed to identify a minimum number of faulty parameters in the system with ambiguities. From sensitivity analysis of the system, we can extract solution invariant matrix and identify singular cofactors of this matrix. The approach can be extended to the electro-mechanical systems, which combine electronic circuits with mechanical components
Keywords :
analogue integrated circuits; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; sensitivity analysis; analog system; electromechanical system; fault diagnosis; low-testability system; mixed-mode system; sensitivity analysis; singular cofactor; solution invariant matrix; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Equations; Fault detection; Fault diagnosis; Fault location; Sensitivity analysis; System testing;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.856412
