Unifying methodologies for high fault coverage concurrent and off-line test of digital filters

Author

Bayraktaroglu, Ismet ; Orailoglu, Alex

Author_Institution

Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA

Volume

2

fYear

2000

fDate

2000

Firstpage

705

Abstract

A low-cost on-line test scheme for digital filters that additionally provides an off-line BIST solution is proposed. The scheme utilizes an invariant of the digital filter in order to detect on-line possible circuit malfunctions. The on-line checking hardware is shared with off-line BIST. The analysis performed indicates that exact 100% fault secureness is attained when the digital filter is designed according to design criteria that we identify in the paper. Furthermore, fault simulations show near 100% fault coverage for off-line BIST

Keywords

automatic testing; built-in self test; digital filters; fault simulation; integrated circuit testing; logic testing; circuit malfunctions; concurrent testing; design criteria; digital filters; fault coverage; fault simulations; high fault coverage; low-cost online test scheme; offline BIST solution; offline testing; online checking hardware; unifying methodologies; Built-in self-test; Circuit faults; Clocks; Computer science; Costs; Delay; Digital filters; Fault detection; Hardware; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on

Conference_Location

Geneva

Print_ISBN

0-7803-5482-6

Type

conf

DOI

10.1109/ISCAS.2000.856426

Filename

856426