• DocumentCode
    2233729
  • Title

    Pico-Newton order force measurement using a calibrated carbon nanotube probe by electromechanical resonance

  • Author

    Arai, Fumihito ; Nakajima, Masahiro ; Dong, Lixin ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro Syst. Eng., Nagoya Univ., Japan
  • Volume
    1
  • fYear
    2003
  • fDate
    14-19 Sept. 2003
  • Firstpage
    300
  • Abstract
    Force measurement with pico-Newton (pN) order resolution using a carbon nanotube (CNT) probe, which is calibrated by the electromechanical resonance is presented. Based on the theoretical analysis, a CNT is suitable material for the sensitive force measurement. A CNT probe is constructed by attaching a CNT to the tip of the commercially available atomic force microscope (AFM) cantilever or tungsten needle probe by the electron-beam-induced deposition (EBID) though the nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). In order to attach a CNT quickly and correctly, CNTs are dispersed in ethanol by ultrasonic waves for several hours and oriented by electrophoresis. The elastic moduli of CNTs are calibrated from electromechanical resonance frequency by applied electrostatic forces. We measured pico-Newton order contact forces with a CNT probe, which is constructed with nanorobotic manipulators, by measuring deformation of a CNT probe from FE-SEM images.
  • Keywords
    calibration; carbon nanotubes; elastic moduli; electron beam deposition; electron probes; electrostatics; field emission electron microscopes; force measurement; manipulators; nanotube devices; resonance; scanning electron microscopes; atomic force microscope cantilever; calibrated carbon nanotube probe; contact force; elastic moduli; electromechanical resonance; electron-beam-induced deposition; electrophoresis; ethanol; field-emission scanning electron microscope; nanorobotic manipulators; nanotube deformation; nanotube dispersion; picoNewton order force measurement; tungsten needle probe; ultrasonic waves; Atomic force microscopy; Atomic layer deposition; Carbon nanotubes; Electrostatic measurements; Force measurement; Joining processes; Probes; Resonance; Scanning electron microscopy; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 2003. Proceedings. ICRA '03. IEEE International Conference on
  • ISSN
    1050-4729
  • Print_ISBN
    0-7803-7736-2
  • Type

    conf

  • DOI
    10.1109/ROBOT.2003.1241612
  • Filename
    1241612