DocumentCode
2233837
Title
Intrinsic microwave dielectric loss of lanthanum aluminate
Author
Shimada, T. ; Ichikawa, K. ; Minemura, T. ; Yamauchi, H. ; Utsumi, W. ; Ishii, Y. ; Breeze, J. ; Alford, Neil McN
Author_Institution
New Bus. Dev. Center, Hitachi Metals Ltd., Shimamoto, Japan
fYear
2009
fDate
23-27 Aug. 2009
Firstpage
1
Lastpage
5
Abstract
The intrinsic dielectric properties of LaAlO3 were investigated in order to understand the microwave properties for several material containing LaAlO3. LaAlO3 single crystal was the prepared by Czochralski method. The temperature dependence of the dielectric properties and neutron inelastic scattering of the single crystal were measured. From these data, the intrinsic dielectric properties were evaluated and it was found that the dielectric loss of the LaAlO3 includes two types of dielectric loss. One is a phonon absorption related loss and the other is the loss arising from Debye type orientation polarization. The latter affects the room temperature dielectric loss in LaAlO3 containing materials. The present study suggested that removing this polarization loss is important to decrease the total dielectric loss.
Keywords
Debye temperature; crystal growth from melt; dielectric losses; dielectric polarisation; lanthanum compounds; microwave spectra; phonons; Czochralski method; Debye type orientation polarization; LaAlO3; intrinsic microwave dielectric loss; lanthanum aluminate; neutron inelastic scattering; phonon absorption; polarization; room temperature; temperature 293 K to 298 K; Crystalline materials; Dielectric losses; Dielectric materials; Dielectric measurements; Lanthanum; Neutrons; Phonons; Polarization; Scattering; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location
Xian
ISSN
1099-4734
Print_ISBN
978-1-4244-4970-5
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2009.5307570
Filename
5307570
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