• DocumentCode
    2234663
  • Title

    Investigation of CuInP2S6 family lyered crystals for ultrasonic transducers

  • Author

    Dziaugys, A. ; Banys, J. ; Samulionis, V. ; Vysochanskii, Yulian

  • Author_Institution
    Dept. of Radiophys., Vilnius Univ., Vilnius, Lithuania
  • fYear
    2009
  • fDate
    23-27 Aug. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Investigation results of piezoelectric and dielectric (20 Hz - 1 MHz) properties of layered CuInP2S6 crystals with different compositions and stoichiometry are presented. It was shown that largest phase transition temperature Tc ap 330K was observed for indium rich CuInP2S6 crystals. In these CuIn1+deltaP2S6 crystals at room temperature electromechanical coupling constant comparable to that of pure CuInP2S6 could be obtained after appropriate poling. Critical dielectric anomalies are found at the phase transitions. It was shown that above phase transition the dielectric properties are strongly influenced by high electrical conductivity. The DC conductivity and conductivity relaxation time exhibits an anomaly close to the phase transition temperature Tc=330 K. Its activation energy exhibit only a weak change close to the ferrielectric phase transition temperature in investigated crystals.
  • Keywords
    copper compounds; dielectric materials; dielectric relaxation; dielectric thin films; electrical conductivity; ferroelectric transitions; indium compounds; phosphorus compounds; piezoelectric materials; stoichiometry; ultrasonic transducers; CuInP2S6; DC conductivity; activation energy; dielectric property; electrical conductivity; ferrielectric phase transition temperature; frequency 20 Hz to 1 MHz; layered crystals; phase transition temperature; piezoelectric property; relaxation time; room temperature electromechanical coupling constant; stoichiometry; temperature 293 K to 298 K; temperature 330 K; ultrasonic transducers; Electronic design automation and methodology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
  • Conference_Location
    Xian
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-4970-5
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2009.5307601
  • Filename
    5307601