DocumentCode
2234663
Title
Investigation of CuInP2 S6 family lyered crystals for ultrasonic transducers
Author
Dziaugys, A. ; Banys, J. ; Samulionis, V. ; Vysochanskii, Yulian
Author_Institution
Dept. of Radiophys., Vilnius Univ., Vilnius, Lithuania
fYear
2009
fDate
23-27 Aug. 2009
Firstpage
1
Lastpage
5
Abstract
Investigation results of piezoelectric and dielectric (20 Hz - 1 MHz) properties of layered CuInP2S6 crystals with different compositions and stoichiometry are presented. It was shown that largest phase transition temperature Tc ap 330K was observed for indium rich CuInP2S6 crystals. In these CuIn1+deltaP2S6 crystals at room temperature electromechanical coupling constant comparable to that of pure CuInP2S6 could be obtained after appropriate poling. Critical dielectric anomalies are found at the phase transitions. It was shown that above phase transition the dielectric properties are strongly influenced by high electrical conductivity. The DC conductivity and conductivity relaxation time exhibits an anomaly close to the phase transition temperature Tc=330 K. Its activation energy exhibit only a weak change close to the ferrielectric phase transition temperature in investigated crystals.
Keywords
copper compounds; dielectric materials; dielectric relaxation; dielectric thin films; electrical conductivity; ferroelectric transitions; indium compounds; phosphorus compounds; piezoelectric materials; stoichiometry; ultrasonic transducers; CuInP2S6; DC conductivity; activation energy; dielectric property; electrical conductivity; ferrielectric phase transition temperature; frequency 20 Hz to 1 MHz; layered crystals; phase transition temperature; piezoelectric property; relaxation time; room temperature electromechanical coupling constant; stoichiometry; temperature 293 K to 298 K; temperature 330 K; ultrasonic transducers; Electronic design automation and methodology;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location
Xian
ISSN
1099-4734
Print_ISBN
978-1-4244-4970-5
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2009.5307601
Filename
5307601
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