Improving on-line BIST-based diagnosis for roving STARs

Author

Abramovici, Miron ; Stroud, Charles ; Skaggs, Brandon ; Emmert, John

Author_Institution

Lucent Technol. Bell Labs., Murray Hill, NJ, USA

fYear

2000

fDate

2000

Firstpage

31

Lastpage

39

Abstract

We present improvements to our on-line BIST-based diagnosis technique originally used in the roving STARs approach. The enhanced technique starts with a new method of analyzing the BIST results, and employs the original divide-and-conquer method as a second phase only when the first phase fails or it does not achieve maximum diagnostic resolution. The combined technique significantly reduces the diagnosis time, improves the resolution in several cases, and also requires less fault-free resources

Keywords

automatic testing; built-in self test; divide and conquer methods; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; combined technique; diagnosis time reduction; divide/conquer method; maximum diagnostic resolution; online BIST-based diagnosis; online FPGA testing; roving STARs; Built-in self-test; Control systems; Design optimization; Fault diagnosis; Fault tolerant systems; Field programmable gate arrays; Logic testing; Process control; Runtime; Tiles;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International

Conference_Location

Palma de Mallorca

Print_ISBN

0-7695-0646-1

Type

conf

DOI

10.1109/OLT.2000.856608

Filename

856608