A crosstalk sensor implementation for measuring interferences in digital CMOS VLSI circuits

Author

Sainz, J.A. ; Roca, M. ; Muñoz, R. ; Maiz, J.A. ; Aguado, L.A.

Author_Institution

Dept. of Electron. & Telecommun., Univ. of the Basque Country, Vitoria-Gasteiz, Spain

fYear

2000

fDate

2000

Firstpage

45

Lastpage

51

Abstract

This paper presents an approach for measuring crosstalk interference in digital CMOS VLSI circuits. The crosstalk sensor has been implemented in 0.8 μm AMS (Austria Mikro Systeme) technology and its design is based on NOR and NAND RS latches. The interference is produced by an up (down) transition in an affecting line. The crosstalk sensor is designed to measure crosstalk interference amplitude produced by capacitive coupling between long metal lines. The sensor is programmable for measuring some ranges of crosstalk amplitude. The sensor design is based on the dynamic behavior of basic NOR and NAND gates depending on the MOS transistor sizes

Keywords

CMOS digital integrated circuits; VLSI; crosstalk; electric noise measurement; electric sensing devices; integrated circuit measurement; integrated circuit testing; programmable circuits; 0.8 micron; AMS technology; Austria Mikro Systeme technology; NAND RS latches; NOR RS latches; capacitive coupling; crosstalk amplitude; crosstalk interference; crosstalk sensor implementation; digital CMOS VLSI circuits; interference measurement; metal lines; programmable sensor; CMOS digital integrated circuits; Coupling circuits; Crosstalk; Impedance; Integrated circuit interconnections; Interference; Latches; Semiconductor device measurement; Sensor phenomena and characterization; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2000. Proceedings. 6th IEEE International

Conference_Location

Palma de Mallorca

Print_ISBN

0-7695-0646-1

Type

conf

DOI

10.1109/OLT.2000.856611

Filename

856611