Title :
Unusually stable ferroelectric 180° a-a nanostripe and nanoneedle domains in thin films prepared from a bulk single crystal of BaTiO3 with FIB: TEM observations and phase-field simulations
Author :
Matsumoto, Takao ; Okamoto, Masakuni
Author_Institution :
Central Res. Lab., Hitachi, Ltd., Kokubunji, Japan
Abstract :
Unusually stable ferroelectric 180deg a-a nanostripe domain structure in a thin (les100 nm) film prepared from a bulk single crystal of BaTiO3 with focused-ion beam (FIB) was observed by transmission electron microscopy (TEM). The domain consists of alternate sequences of narrow and wide anti-parallel domains. High-magnification images of a stable 180deg nanoneedle domain, with a sharp tip penetrating into the nanostripe domains, were also obtained. Two-dimensional phase-field simulations based on TDGL equations suggest that such a domain structure is stabilized by an in-plane anisotropic stress and an anisotropic mechanical boundary condition of the thin film prepared with FIB.
Keywords :
barium compounds; electric domains; ferroelectric thin films; focused ion beam technology; nanofabrication; nanostructured materials; transmission electron microscopy; BaTiO3; FIB; TDGL equations; TEM; anisotropic stress; focused-ion beam; mechanical boundary condition; nanoneedle domains; phase-field simulations; sharp tip penetration; stable ferroelectric nanostripe films; transmission electron microscopy; Anisotropic magnetoresistance; Electron beams; Equations; Ferroelectric films; Ferroelectric materials; Focusing; Nanostructures; Stress; Transistors; Transmission electron microscopy;
Conference_Titel :
Applications of Ferroelectrics, 2009. ISAF 2009. 18th IEEE International Symposium on the
Conference_Location :
Xian
Print_ISBN :
978-1-4244-4970-5
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2009.5307617