Performance evaluation of In-Circuit Testing on QCA based circuits

Quantum-Dot Cellular automata based circuits (QCA) are one of the favorite novel technologies, which operates on binary data at the nanometer-scale; in which logical operations and data movement are accomplished via Columbic interaction rather than electric current flow leading to a very little power dissipation. Since circuits made from QCA devices could provide various “wins” over CMOS, in recent years there has been an influx of QCA-related research. However before implementing every circuit, its testability and reliability must be mentioned. Hence, testing of these devices is our main concern in this paper and we will show how to perform In-Circuit-Testing on them and the differences and difficulties which is caused by the quantum entity of these circuits.