DocumentCode
2237097
Title
Integrated model-based approach and test framework for embedded systems
Author
Iyenghar, Padma ; Pulvermueller, Elke ; Westerkamp, Clemens ; Wuebbelmann, Juergen
Author_Institution
Software Eng. Res. Group, Univ. of Osnabueck, Germany
fYear
2011
fDate
13-15 Sept. 2011
Firstpage
1
Lastpage
8
Abstract
In the recent decade, new automated methodologies such as the Model Driven Development (MDD) and Model-Based Testing (MBT) are under evaluation for embedded systems development and testing. However, most of the currently existing MBT approaches are neither integrated with the software development process nor transferred to real-life embedded software engineering projects. There is also a lack of usage of corresponding modeling languages for the MDD and MBT phases. In this context, this paper discusses the applicability of an integrated model-based approach and test framework which addresses the aforementioned gaps. The approach is evaluated in a spark extinguishing embedded system example based on a real-life embedded software engineering project. A test framework generation algorithm which generates the necessary artifacts for deploying MBT in resource-constrained embedded systems is discussed. A prototype implementation of the proposed approach and illustrative examples are presented.
Keywords
embedded systems; formal specification; program testing; simulation languages; MBT; MDD; automated methodologies; embedded systems development; integrated model-based approach; model driven development; model-based testing; modeling languages; real-life embedded software engineering projects; resource-constrained embedded systems; software development process; Algorithm design and analysis; Embedded software; Embedded systems; Monitoring; Sparks; Testing; Unified modeling language; Model-Based Testing (MBT); UML; UTP; embedded systems; test framework;
fLanguage
English
Publisher
ieee
Conference_Titel
Specification and Design Languages (FDL), 2011 Forum on
Conference_Location
Oldenburg
ISSN
1636-9874
Print_ISBN
978-1-4577-0763-6
Electronic_ISBN
1636-9874
Type
conf
Filename
6069477
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