Scattering-type Near-field Microscopy: From Nanoscale Infrared Material Recognition to Superlens Studies

Author

Hillenbrand, R.

Author_Institution

Nano-Photonics Group, Max-Planck-Inst. fur Biochem., Martinsried

fYear

2007

fDate

26-31 Aug. 2007

Firstpage

1

Lastpage

2

Abstract

We demonstrate that scattering-type near-field optical microscopy (s-SNOM) allows nanoscale resolved infrared mapping of materials and electron concentrations e.g. in cross-sectional samples of semiconductor nanostructures. s-SNOM can be also applied to map the optical near fields of novel photonic structures as we show with a SiC superlens.

Keywords

infrared imaging; lenses; light scattering; nanostructured materials; near-field scanning optical microscopy; optical materials; wide band gap semiconductors; SiC; electron concentrations; infrared material recognition; nanoscale material recognition; nanoscale resolved infrared mapping; near-field microscopy; optical near fields; photonic structures; scattering-type microscopy; semiconductor nanostructures; superlens; Electron microscopy; Electron optics; Nanostructured materials; Optical materials; Optical microscopy; Optical scattering; Particle scattering; Semiconductor materials; Semiconductor nanostructures; Silicon carbide;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics - Pacific Rim, 2007. CLEO/Pacific Rim 2007. Conference on

Conference_Location

Seoul

Print_ISBN

978-1-4244-1173-3

Electronic_ISBN

978-1-4244-1174-0

Type

conf

DOI

10.1109/CLEOPR.2007.4391104

Filename

4391104