DocumentCode :
2242668
Title :
Panel: Analog Characterization and Test: The Long Road to Realization
Author :
Sinha, Arani ; Majumdar, Amitava ; Ganti, Vasu
fYear :
2009
fDate :
3-7 May 2009
Firstpage :
337
Lastpage :
337
Keywords :
Analog circuits; Automatic testing; Circuit noise; Circuit testing; Frequency measurement; Signal processing; Temperature dependence; Temperature sensors; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS '09. 27th IEEE
Conference_Location :
Santa Cruz, CA, USA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.65
Filename :
5116657
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2242668
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