Title :
Oscillation-based Test Method for Continuous-time OTA-C Filters
Author :
Hasan, Masood-ul ; Sun, Yichuang
Author_Institution :
Sch. of Electron. Comput. & Electr. Eng., Hertfordshire Univ., Hatfield
Abstract :
Design for testability technique using oscillation-based test topology for KHN OTA-C filters is proposed. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate the faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis as well as effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of KHN OTA-C filter. Simulation results in 0.25mum CMOS technology show that the proposed oscillation-based test strategy has 84% fault coverage and with a minimum number of extra components, requires a negligible area overhead
Keywords :
CMOS integrated circuits; built-in self test; continuous time filters; design for testability; fault diagnosis; operational amplifiers; oscillators; CMOS technology; OTA-C filter testing; area overhead; built-in self test; continuous-time filters; design for testability; fault diagnosis; oscillation-based test; vectorless output test; Automatic testing; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Cutoff frequency; Design for testability; Filters; Oscillators; Topology; OBT for OTA-C Filters; OTA-C Filter testing;
Conference_Titel :
Circuits and Systems, 2006. APCCAS 2006. IEEE Asia Pacific Conference on
Conference_Location :
Singapore
Print_ISBN :
1-4244-0387-1
DOI :
10.1109/APCCAS.2006.342188