DocumentCode :
2244570
Title :
Micromanipulation contact transition control by selective focusing and microforce control
Author :
Yang, Ge ; Nelson, Bradley J.
Author_Institution :
Dept. of Mech. Eng., Minnesota Univ., Minneapolis, MN, USA
Volume :
3
fYear :
2003
fDate :
14-19 Sept. 2003
Firstpage :
3200
Abstract :
A fundamental requirement of micromanipulation is to control the impact force and subsequently the contact force in the transition of the micromanipulator end-effector from noncontact to contact state. This is especially important in protecting fragile microstructures and preventing undesirable motion. This paper proposes a method of using the integration of selective focusing and microforce control to achieve fast transition control while minimizing impact force. The method is applied to contact transition in microassembly pick-and-place operations. The initial long-range approach motion of the end-effector towards its target is controlled based on focus measures computed from images captured through a microscope. When the end-effector comes into focus near the target, the system switches to microforce control to minimize impact force and to regulate the contact force. An optics model for microscope focusing is proposed to characterize the dynamic behavior of the end-effector images during the approach motion. The connection between this model and the scale-space theory of computer vision is emphasized. Three different focus measures are tested and compared in performance. The proposed method has been experimentally verified to be able to achieve fast transition control with minimal impact force.
Keywords :
computer vision; focusing; force control; microassembling; micromanipulators; microscopes; motion control; computer vision; contact force; contact state; contact transition; end effector images; end effector motion; focusing control; fragile microstructures; impact force control; microassembly; microforce control; micromanipulation contact transition control; micromanipulator transition; microscope; noncontact state; optics model; pick-and-place operations; scale-space theory; system switches; undesirable motion; Focusing; Force control; Microassembly; Micromanipulators; Microscopy; Microstructure; Motion control; Motion measurement; Optical switches; Protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation, 2003. Proceedings. ICRA '03. IEEE International Conference on
ISSN :
1050-4729
Print_ISBN :
0-7803-7736-2
Type :
conf
DOI :
10.1109/ROBOT.2003.1242083
Filename :
1242083
Link To Document :
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