Title :
Low-Energy Proton Testing Using the Boeing Radiation Effects Laboratory 2.2 MeV Dynamitron
Author :
Wert, Jerry ; Russell, Dennis ; Bartholet, Bill ; Clemen, Mark ; Koehn, Jason ; Schasteen, Bill ; Cannon, Ethan ; Cabanas-Holmen, Manuel
Author_Institution :
Boeing Co., Seattle, WA, USA
Abstract :
This paper describes the use of the BREL Dynamitron accelerator for low-energy (≤ 2MeV) single event effects testing of semiconductor devices. A description of the Dynamitron and test data shall be given.
Keywords :
radiation hardening (electronics); semiconductor device testing; BREL dynamitron accelerator; Boeing radiation effect laboratory dynamitron; electron volt energy 2.2 MeV; low-energy proton testing; low-energy single event effect testing; semiconductor devices; test data; Companies; Electronic mail; Particle beams; Protons; Random access memory; Testing; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2012 IEEE
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4673-2730-5
DOI :
10.1109/REDW.2012.6353727
