DocumentCode :
2245357
Title :
Fast computation of 3D inhomogeneous scattered field using a discrete BCG-FFT algorithm
Author :
Hong Gan ; Weng Cho Chew
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume :
3
fYear :
1995
fDate :
18-23 June 1995
Firstpage :
1532
Abstract :
In this paper, we present a discrete formulation for solving the 3D scattering problems. The scattered fields from dielectric scatterers with arbitrary geometry are modeled using integral equation with equivalent sources. The inhomogeneity of the parameter of the scatterer is approximated by a set of 3D simple functions. The total field is represented by a set of local basis functions. A Galerkin testing formulation is applied and no approximation is made to the differential operators involved in the integral equation except for the projection of the unknown field and the operators onto the subspace spanned by the basis functions. It will be shown that the testing formulation can be represented by a multi-input and multi-output system with known linear kernels. The kernels are discretized using the rooftop basis functions and they are independent of the scattering configuration and the incident waves. Consequently, for a given sampling rate per wavelength, one need only evaluate once the kernels whose storage is of order N. The problem of solving the integral equation is similar to the deconvolution problem where the unknown fields inside the scatterers are modulated with the dielectric permittivity distribution.
Keywords :
Galerkin method; conjugate gradient methods; discrete Fourier transforms; electromagnetic fields; electromagnetic wave scattering; integral equations; inverse problems; 3D inhomogeneous scattered field; 3D scattering problems; Galerkin testing formulation; biconjugate gradient; dielectric scatterers; discrete BCG-FFT algorithm; integral equation; linear kernels; local basis functions; multi-input multi-output system; rooftop basis functions; sampling rate; scattering configuration; Deconvolution; Dielectrics; Geometry; Integral equations; Kernel; Permittivity; Sampling methods; Scattering parameters; Solid modeling; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
0-7803-2719-5
Type :
conf
DOI :
10.1109/APS.1995.530868
Filename :
530868
Link To Document :
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