DocumentCode
2245357
Title
Fast computation of 3D inhomogeneous scattered field using a discrete BCG-FFT algorithm
Author
Hong Gan ; Weng Cho Chew
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
3
fYear
1995
fDate
18-23 June 1995
Firstpage
1532
Abstract
In this paper, we present a discrete formulation for solving the 3D scattering problems. The scattered fields from dielectric scatterers with arbitrary geometry are modeled using integral equation with equivalent sources. The inhomogeneity of the parameter of the scatterer is approximated by a set of 3D simple functions. The total field is represented by a set of local basis functions. A Galerkin testing formulation is applied and no approximation is made to the differential operators involved in the integral equation except for the projection of the unknown field and the operators onto the subspace spanned by the basis functions. It will be shown that the testing formulation can be represented by a multi-input and multi-output system with known linear kernels. The kernels are discretized using the rooftop basis functions and they are independent of the scattering configuration and the incident waves. Consequently, for a given sampling rate per wavelength, one need only evaluate once the kernels whose storage is of order N. The problem of solving the integral equation is similar to the deconvolution problem where the unknown fields inside the scatterers are modulated with the dielectric permittivity distribution.
Keywords
Galerkin method; conjugate gradient methods; discrete Fourier transforms; electromagnetic fields; electromagnetic wave scattering; integral equations; inverse problems; 3D inhomogeneous scattered field; 3D scattering problems; Galerkin testing formulation; biconjugate gradient; dielectric scatterers; discrete BCG-FFT algorithm; integral equation; linear kernels; local basis functions; multi-input multi-output system; rooftop basis functions; sampling rate; scattering configuration; Deconvolution; Dielectrics; Geometry; Integral equations; Kernel; Permittivity; Sampling methods; Scattering parameters; Solid modeling; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location
Newport Beach, CA, USA
Print_ISBN
0-7803-2719-5
Type
conf
DOI
10.1109/APS.1995.530868
Filename
530868
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