• DocumentCode
    2245666
  • Title

    Guide to the 2011 IEEE Radiation Effects Data Workshop Record

  • Author

    Hiemstra, David M.

  • Author_Institution
    MDA Space Missions, Brampton, ON, Canada
  • fYear
    2012
  • fDate
    16-20 July 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The 2011 Workshop Record has been reviewed and a table prepared to facilitate the search for radiation response data by part number, type, or effect.
  • Keywords
    IEEE standards; radiation hardening (electronics); IEEE radiation effect data; radiation response data; Conferences; MOSFET circuits; Microelectronics; Operational amplifiers; Radiation effects; Regulators; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2012 IEEE
  • Conference_Location
    Tucson, AZ
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4673-2730-5
  • Type

    conf

  • DOI
    10.1109/REDW.2012.6353745
  • Filename
    6353745
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2245666