Haptic Sensing and Modeling of Nanomanipulation with an AFM

Author

Fok, L.M. ; Liu, Y.H. ; Li, Wen J.

Author_Institution

Lab. of Robot Control, Hong Kong Chinese Univ.

fYear

2004

fDate

22-26 Aug. 2004

Firstpage

452

Lastpage

457

Abstract

This paper describes a virtual reality and haptic interface between human and the atomic force microscope (AFM), which allows the operator to sense and touch the surface and nanoparticles during the manipulation with an AFM tip. The tip-sample interaction forces and intermolecular forces between the tip and surface are modeled based on Lennard-Jones potential and JKR theory, respectively. Our objective is to provide a 3D virtual reality interface capable of displaying topography of surface for the users and allow them to predict the results for the manipulation

Keywords

Lennard-Jones potential; atomic force microscopy; haptic interfaces; intermolecular forces; nanotechnology; physics computing; virtual reality; 3D virtual reality interface; JKR theory; Lennard-Jones potential; atomic force microscope; haptic sensing; intermolecular force modeling; nanomanipulation modeling; tip-sample interaction force modeling; Atomic force microscopy; Haptic interfaces; Lithography; Polymer films; Probes; Rough surfaces; Surface roughness; Surface topography; Virtual reality; Voltage; Atomic Force Microscope; Haptic Interface; Nanomanipulation; Virtual Reality;

fLanguage

English

Publisher

ieee

Conference_Titel

Robotics and Biomimetics, 2004. ROBIO 2004. IEEE International Conference on

Conference_Location

Shenyang

Print_ISBN

0-7803-8614-8

Type

conf

DOI

10.1109/ROBIO.2004.1521821

Filename

1521821