DocumentCode :
2245734
Title :
Feasibility and characterization study of Al and Au wire bonding on immersion Ag and Sn coatings
Author :
Szeto, W.K. ; Chum, C.C. ; Kim, Jang-Kyo ; Sze, Albert ; Cheung, Y.M.
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., China
fYear :
2001
fDate :
2001
Firstpage :
56
Lastpage :
62
Abstract :
Immersion Ag and immersion Sn coatings obtained through the electroless process have emerged as an alternative to Ni/Au metallisation layers for more uniform thickness and lower material cost. Microscopic studies by SEM, AFM and TEM indicated that the Ag coating had a finer surface morphology and lower thickness than the Sn coating. Composition study by XPS indicated that copper and sulphur were present in the Ag coating surface, indicating migration of the underlying copper layer and tarnishing of the silver surface. Further study based on the D-SIM revealed that both the Ag and Sn immersion coatings were organometallic in nature. Wire bond mechanical tests showed that both the Al and Au wires were bondable on immersion Ag finish. However, the bondability of these two wires on immersion Sn was poor due likely to the low melting point of the Sn intermetallic. Further study is required to verify whether grain size and hardness of Sn finish would affect wire bondability. Plasma treatment and UV/ozone treatment were applied to these plates with no appreciable improvement in bondability. Fracture analysis of the bonded Ag coating indicated that the wire broke at the neck after pull test, a reflection of lower wire strength at the necked region than at the bonded interface, as also confirmed by the lower pull strength than the shear strength
Keywords :
X-ray photoelectron spectra; aluminium; atomic force microscopy; electroless deposition; electromigration; fracture; gold; grain size; hardness; interface structure; lead bonding; mechanical testing; plasma materials processing; scanning electron microscopy; silver; surface treatment; tin; transmission electron microscopy; ultraviolet radiation effects; AFM; Ag; Ag coating surface Cu/S content; Ag coating surface morphology; Ag coating thickness; Al wire bondability; Al wire bonding; Al-Ag; Al-Sn; Au wire bondability; Au wire bonding; Au-Ag; Au-Sn; Ni/Au metallisation layer; O3; SEM; Sn; Sn intermetallic melting point; TEM; UV/ozone treatment; XPS; bonded interface strength; coating composition; copper layer migration; electroless process; fracture analysis; grain size; hardness; immersion Ag coatings; immersion Ag finish; immersion Sn coatings; material cost; organometallic immersion coatings; plasma treatment; pull strength; pull test; shear strength; silver surface tarnishing; uniform thickness; wire bond mechanical tests; wire neck breakage; wire necked region strength; Bonding; Coatings; Copper; Gold; Metallization; Scanning electron microscopy; Surface morphology; Testing; Tin; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2001. EMAP 2001. Advances in
Conference_Location :
Jeju Island
Print_ISBN :
0-7803-7157-7
Type :
conf
DOI :
10.1109/EMAP.2001.983958
Filename :
983958
Link To Document :
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