DocumentCode :
2247433
Title :
Optimization of custom MOS circuits by transistor sizing
Author :
Conn, A.R. ; Coulman, P.K. ; Haring, R.A. ; Morrill, G.L. ; Visweswariah, C.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1996
fDate :
10-14 Nov. 1996
Firstpage :
174
Lastpage :
180
Abstract :
Optimization of a circuit by transistor sizing is often a slow, tedious and iterative manual process which relies on designer intuition. Circuit simulation is carried out in the inner loop of this tuning procedure. Automating the transistor sizing process is an important step towards being able to rapidly design high-performance, custom circuits. JiffyTune is a new circuit optimization tool that automates the tuning task. Delay, rise/fall time, area and power targets are accommodated. Each (weighted) target can be either a constraint or an objective function. Minimax optimization is supported. Transistors can be ratioed and similar structures grouped to ensure regular layouts. Bounds on transistor widths are supported. JiffyTune uses LANCELOT, a large-scale nonlinear optimization package with an augmented Lagrangian formulation. Simple bounds are handled explicitly and trust region methods are applied to minimize a composite objective function. In the inner loop of the optimization, the fast circuit simulator SPECS is used to evaluate the circuit. SPECS is unique in its ability to efficiently provide time-domain sensitivities, thereby enabling gradient-based optimization. Both the adjoint and direct methods of sensitivity computation have been implemented in SPECS. To assist the user, interfaces in the Cadence and SLED design systems have been constructed.
Keywords :
MOS integrated circuits; circuit CAD; circuit analysis computing; circuit optimisation; circuit tuning; JiffyTune; LANCELOT; SPECS; circuit optimization tool; circuit simulator; custom MOS circuits; nonlinear optimization; transistor sizing; tuning; Circuit optimization; Circuit simulation; Computational modeling; Delay effects; Design optimization; Lagrangian functions; Large-scale systems; MOSFETs; Minimax techniques; Packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
Type :
conf
DOI :
10.1109/ICCAD.1996.569578
Filename :
569578
Link To Document :
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