Title :
Ellipsoidal surface characterization for validating the UTD formulation
Author :
Choudhury, R. ; Jha, R.M.
Author_Institution :
Div. of Aerosp. Electron. & Syst., Nat. Aerosp. Lab., Bangalore, India
Abstract :
The UTD mutual coupling results are presented for an ellipsoid of revolution, for slots located arbitrarily on the surface. Rigorous 3-dimensional ray tracing has been performed by the geodesic constant method. The ellipsoid of revolution, with unequal double curvature surfaces without any edges, provides an ideal surface for verifying the heuristics involved in the UTD (surface-diffracted) formulation.
Keywords :
geometrical theory of diffraction; ray tracing; UTD formulation; ellipsoid of revolution; ellipsoidal surface characterization; geodesic constant method; mutual coupling; radiation pattern; rigorous 3-dimensional ray tracing; surface-diffraction; Admittance; Antenna measurements; Antenna radiation patterns; Antennas and propagation; Diffraction; Ellipsoids; Integral equations; Mutual coupling; Optimization methods; Performance evaluation;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
0-7803-2719-5
DOI :
10.1109/APS.1995.530966
