DocumentCode :
2248987
Title :
MPL first-look results from LINC
Author :
Reagan, J. ; Powell, D. ; Erxleben, W. ; Rubio, M. ; Spinhirne, J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Volume :
4
fYear :
2000
fDate :
2000
Firstpage :
1622
Abstract :
A Lidar IN-situ Comparison (LINC) experiment was conducted at Bondville, IL during the second half of August and September 1999. A primary objective of LINC was to compare aerosol extinction and backscatter properties remotely sensed by lidar and in-situ sampled with a suite of instruments featuring a new 180° backscatter nephelometer. The LINC experiment featured the use of two micro-pulse lidar (MPL) systems provided on loan from NASA Langley Research Center. Assistance in readying the lidars for deployment plus the loan of a slant-path mirror system was provided by the MPL research group at NASA Goddard Space Flight Center. One of the MPLs was operated horizontally and aligned on the in-situ sampler inlet to permit lidar extinction. The second MPL was fitted with the moveable mirror system to enable vertical and slant-angle measurements. This paper reports first-look results of aerosol extinction retrievals from selected horizontal lidar measurements as well as vertical profiles from the second MPL system that demonstrate the variable structure of the atmospheric mixing-layer
Keywords :
aerosols; atmospheric composition; atmospheric optics; atmospheric techniques; optical radar; remote sensing by laser beam; AD 1999; Bondville; Illinois; LINC; Lidar IN-situ Comparison; MPL; USA; United States; aerosol; atmosphere; backscatter; boundary layer; extinction; laser remote sensing; lidar; light scattering; measurement technique; micro-pulse lidar; mixing-layer; optics; vertical profile; Aerosols; Atmospheric measurements; Backscatter; Bonding; Instruments; Laser radar; Mirrors; Multiprotocol label switching; NASA; Pollution measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
Type :
conf
DOI :
10.1109/IGARSS.2000.857291
Filename :
857291
Link To Document :
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