• DocumentCode
    2249121
  • Title

    Controlling EMI in telecommunications ICs

  • Author

    Perez, Reinaldo

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    1
  • fYear
    2002
  • fDate
    19-23 Aug. 2002
  • Firstpage
    345
  • Abstract
    Today´s complex, deep submicron system-on-chip (SOC) designs, with their smallest feature sizes, increased densities, higher frequencies, and lower supply voltages, have made noise coupling at the packaging and substrate level, key issues for wireless designers of ICs. Until recently, designers have been forced to use rule-of-thumb methodologies to guard against crosstalk at the substrate and packaging level. New substrate modeling and package modeling analysis tools outline in this work have made it possible for designers to understand the effects of noise coupling across their chip´s substrates and packaging, and to address the problem early in the design cycle. Finally, transient voltages are a fact of life in telecommunications equipment. The increase complexity of semiconductors has made them more sensitive to the effects of overvoltage due to decreasing geometries. In this work, the authors suggest the selection of protection circuits.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; integrated circuits; system-on-chip; telecommunication equipment; EMI control; crosstalk; deep submicron system-on-chip designs; package modeling analysis tools; protection circuits selection; substrate modeling; telecommunications ICs; telecommunications equipment; transient voltages; wireless designers; Crosstalk; Electromagnetic interference; Frequency; Noise level; Packaging machines; Semiconductor device noise; Substrates; System-on-a-chip; Telecommunication control; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
  • Conference_Location
    Minneapolis, MN, USA
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.2002.1032501
  • Filename
    1032501